A deconvolution solution to aliasing confusion in apparently undersampled oblique plane microscopy
Lamb, J. R.; McFadden, C.; Fiolka, R.; Manton, J. D.
Show abstract
In oblique plane microscopy, a remote refocussing system is used to create an aberration-free 3D image of the object, from which an inclined plane is sampled using a tilted imaging system. As a result, unlike in conventional microscopes, the point spread function (PSF) and optical transfer function (OTF) are tilted with respect to the optical axis of the imaging system. This suggests that a small sample-scanning step size is required to satisfy the Nyquist-Shannon sampling criterion. Recently, we have shown that a careful choice of apparent undersampling leads to aliased OTF copies that can be separated and stitched together in Fourier space to form a properly sampled OTF. In our demonstrations, this led to acquisition speed gains of between twoand four-fold. Here, we introduce a deconvolution-based method to reconstruct properly sampled volumes from apparently undersampled datasets that outperforms our previous Fourier-stitching approach.
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