Fast imaging of millimeter-scale areas with beam deflection transmission electron microscopy
Zheng, Z.; Own, C. S.; Wanner, A. A.; Koene, R. A.; Hammerschmith, E. W.; Silversmith, W. M.; Kemnitz, N.; Tank, D. W.; Seung, H. S.
Show abstract
Serial section transmission electron microscopy (TEM) has proven to be one of the leading methods for millimeter-scale 3D imaging of brain tissues at nanoscale resolution. It is important to further improve imaging efficiency to acquire larger and more brain volumes. We report here a three fold increase in the speed of TEM by using a beam deflecting mechanism to enable highly efficient acquisition of multiple image tiles (nine) for each motion of the mechanical stage. For millimeter-scale areas, the duty cycle of imaging doubles to more than 30%, yielding a net average imaging rate of 0.3 gigapixels per second. If fully utilized, an array of beam deflection TEMs should be capable of imaging a dataset of cubic millimeter scale in several weeks.
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